Fault Diagnosis with Orthogonal Compactors in Scan-Based Designs
نویسندگان
چکیده
منابع مشابه
Improved Methods for Fault Diagnosis in Scan-Based BIST
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ژورنال
عنوان ژورنال: Journal of Electronic Testing
سال: 2011
ISSN: 0923-8174,1573-0727
DOI: 10.1007/s10836-011-5243-6